CN
苏州美芝恩电子科技有限公司
CN
苏州美芝恩电子科技有限公司
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Structural Inspection
AFM
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Use

Principle

The surface structure and properties of materials are studied by detecting the extremely weak atomic interaction force between the surface of the sample to be tested and a miniature force sensitive element.

Support

Atomic force microscopy provides true three-dimensional surface maps, does not require any special sample preparation, and works well at atmospheric pressure and even in liquid environments.

Technical Indicators

  • Resolution

    The vertical resolution can reach 0.01nm, and the horizontal resolution can reach 0.1nm;

  • Working Mode

    Multiple working modes, including contact mode, tapping mode (amplitude modulation mode) and non-contact mode (frequency modulation mode);

  • XY noise level

    < 0.15 nm。

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